Tektronix Catalog 1969

Test and Measurement’s Docs Vintage Catalogs Tektronix Catalog 1969

Tektronix products are grouped according to common characteristics on pages 2, 3, 4, 5. You can compare the performance of a group of instruments that share similar characteristics with your measurement requirements. For example, those oscilloscopes that feature portability; those oscilloscopes that use the same group of plug-in units; those oscilloscopes that use the sampling technique for their display; etc. Thorough study of these groupings will give you a better understanding of the Tektronix product line.

Bandwidth, risetime, deflection factor and other instrument parameters are of vital interest to you in selecting the appro- priate instrument for your application. The following outlines information provided for your assistance.

Page 5 contains a chart of available CRT phosphors with technical data as well as selected areas of usage.

Information presented on pages 6 through 10 describes factors affecting over-all oscilloscope performance or measurement capability. Time-base application and selection is discussed initially, including single-shot and delayed-sweep use. Vertical amplifier risetime and high-frequency capabilities are reviewed on page 7.

Starting on page 8 is a discussion of various oscilloscope configurations and how these relate to specific applications including: switched vertical inputs versus dual-beam oscilloscope operation, differential input use, sampling techniques, traveling wave and distributed deflection CRT’s, and curve tracing (X-Y) oscilloscopes.

Page 10 includes a discussion of Photographic Writing Speed considerations, a subject of particular interest to those concerned with photographing an oscilloscope display of a non- recurring phenomenon. Page 10 continues with a discussion of mechanical and environmental characteristics related to electrical instrument performance.


Page 11 offers an introduction to component manufacturing at Tektronix, a capability which contributes significantly toward the design and manufacture of high-performance, reliable instrumentation.


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