Tektronix products are grouped according to common characteristics on pages 2, 3, 4, 5. You can compare the performance of a group of instruments that share similar characteristics with your measurement requirements. For example, those oscilloscopes that feature portability; those oscilloscopes that use the same group of plug-in units; those oscilloscopes that use the sampling technique for their display; etc. Thorough study of these groupings will give you a better understanding of the Tektronix product line.
Bandwidth, risetime, deflection factor and other instrument parameters are of vital interest to you in selecting the appro- priate instrument for your application. The following outlines information provided for your assistance.
Page 5 contains a chart of available CRT phosphors with technical data as well as selected areas of usage.
Information presented on pages 6 through 10 describes factors affecting over-all oscilloscope performance or measurement capability. Time-base application and selection is discussed initially, including single-shot and delayed-sweep use. Vertical amplifier risetime and high-frequency capabilities are reviewed on page 7.
Starting on page 8 is a discussion of various oscilloscope configurations and how these relate to specific applications including: switched vertical inputs versus dual-beam oscilloscope operation, differential input use, sampling techniques, traveling wave and distributed deflection CRT’s, and curve tracing (X-Y) oscilloscopes.
Page 10 includes a discussion of Photographic Writing Speed considerations, a subject of particular interest to those concerned with photographing an oscilloscope display of a non- recurring phenomenon. Page 10 continues with a discussion of mechanical and environmental characteristics related to electrical instrument performance.
Page 11 offers an introduction to component manufacturing at Tektronix, a capability which contributes significantly toward the design and manufacture of high-performance, reliable instrumentation.
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